

操縱梅特勒XP緊密天平檢測顆粒粒度,須要(yao)裝備篩(shai)分(fen)易(yi)巧(qiao)(qiao)稱(cheng)量(liang)(liang)(liang)組(zu)件(jian)(jian)。梅(mei)特(te)勒篩(shai)分(fen)易(yi)巧(qiao)(qiao)稱(cheng)量(liang)(liang)(liang)組(zu)件(jian)(jian),是將樣品篩(shai)牢固在(zai)天(tian)平稱(cheng)量(liang)(liang)(liang)臺上(shang),以便(bian)利顆粒物稱(cheng)量(liang)(liang)(liang)的(de)(de)輔件(jian)(jian)。用戶利用組(zu)件(jian)(jian)將樣品篩(shai)牢固在(zai)天(tian)平稱(cheng)量(liang)(liang)(liang)臺后(hou),只要(yao)輕點觸(chu)摸屏上(shang)的(de)(de)One Click? ,便(bian)可啟用一(yi)鍵稱(cheng)量(liang)(liang)(liang)篩(shai)分(fen)闡發處理計劃,按照屏幕提醒步驟,樣品篩(shai)可慢慢稱(cheng)量(liang)(liang)(liang)。

